Goethite Morphologies Investigated via X-ray Diffraction of Oriented Samples

Robert G. Ford, Paul M. Bertsch and John C. Seaman
University of Georgia, Advanced Analytical Center for Environmental Sciences, Savannah River Ecology Laboratory, Aiken, South Carolina 29802
Present Address: University of Deleware, Department of Plant and Soil Sciences, Newark, Delaware 19717.
Key Words: Goethite • Oriented Film • Particle Morphology • Powder X-ray Diffraction • XRD

Clays and Clay Minerals; October 1997 v. 45; no. 5; p. 769-772; DOI: 10.1346/CCMN.1997.0450515
© 1997, The Clay Minerals Society
Clay Minerals Society (www.clays.org)