Structure Defects in Layer Silicate Clay Minerals

A. K. De, S. Bhattacherjee and G. B. Mitra
School of X-rays and Structure of Matter Department of Physics Indian Institute of Technology Kharagpur, India 721302
Key Words: Defects • Diffraction line profile • Fourier coefficients • Kaolinite • Layer shift • Nontronite

Clays and Clay Minerals; August 1983 v. 31; no. 4; p. 315-316; DOI: 10.1346/CCMN.1983.0310411
© 1983, The Clay Minerals Society
Clay Minerals Society (www.clays.org)