Transmission Electron Microscopy of Fine-Grained Phyllosilicates in Ultra-Thin Rock Sections

P. P. Phakey*, C. D. Curtis and G. Oertel
Department of Geology, University of California, Los Angeles, Calif. 90024, U.S.A.
* Present address: Department of Physics, University of California, Berkeley. (Permanent address: Department of Physics, Monash University, Melbourne, Australia.)
Permanent address: Department of Geology, The University, Sheffield S1 3JD, England.

Abstract: A method is described for preparing electron-transparent sections of fine-grained argillaceous rocks suitable for making transmission micrographs. A sediment and a slate are used as examples. Sections perpendicular to bedding or cleavage yield diffraction patterns with clearly defined 00l reflections. These allow immediate identification of 7, 10 and 14 Å structures. The combination of detailed textural information with structural identification of individual phyllosilicate particles affords a powerful method for the investigation of late diagenetic and early metamorphic changes in sediments.

Clays and Clay Minerals; August 1972 v. 20; no. 4; p. 193-197; DOI: 10.1346/CCMN.1972.0200402
© 1972, The Clay Minerals Society
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